headerdesktop corintwktrgr26apr24

MAI SUNT 00:00:00:00

MAI SUNT

X

headermobile corintwktrgr26apr24

MAI SUNT 00:00:00:00

MAI SUNT

X

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Fred Stevie

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Citeste mai mult

-10%

transport gratuit

PRP: 703.80 Lei

!

Acesta este Pretul Recomandat de Producator. Pretul de vanzare al produsului este afisat mai jos.

633.42Lei

633.42Lei

703.80 Lei

Primesti 633 puncte

Important icon msg

Primesti puncte de fidelitate dupa fiecare comanda! 100 puncte de fidelitate reprezinta 1 leu. Foloseste-le la viitoarele achizitii!

Livrare in 2-4 saptamani

Descrierea produsului

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
Citeste mai mult

De pe acelasi raft

Parerea ta e inspiratie pentru comunitatea Libris!

Acum se comanda

Noi suntem despre carti, si la fel este si

Newsletter-ul nostru.

Aboneaza-te la vestile literare si primesti un cupon de -10% pentru viitoarea ta comanda!

*Reducerea aplicata prin cupon nu se cumuleaza, ci se aplica reducerea cea mai mare.

Ma abonez image one
Ma abonez image one